A physical design tool for built-in self-repairable RAMs
نویسندگان
چکیده
In this paper, we present the description and evaluation of a novel physical design tool, BISRAMGEN, that can generate reconfigurable and fault-tolerant RAM modules. This tool, first proposed in [3], designs a redundant RAM array with accompanying built-in self-test (BIST) and built-in self-repair (BISR) logic that can switch out faulty rows and switch in spare rows. Built-in self-repair causes significant improvement in reliability, production yield, and manufacturing cost of ASICs and microprocessors with embedded RAMs.
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ورودعنوان ژورنال:
- IEEE Trans. VLSI Syst.
دوره 9 شماره
صفحات -
تاریخ انتشار 2001